Abstract submission

Key dates
Abstract submission deadline: 10 December 2010
Notification of acceptance: 20 January 2011
Paper submission deadline: 4 April 2011

Contributions for oral and poster presentations are requested in all of the scientific areas listed below. Abstracts of a maximum of 250 words should be submitted online by 10 December 2010. Authors with an accepted abstract will be invited to submit a full paper for the proceedings published in the Journal of Physics Conference Series.  Instructions for preparing a full paper will be sent to the corresponding author on acceptance of the abstract.

Abstract requirements

• Abstract Size: 250 words
• Figures and references: not permitted
• Abstract deadline: 10 December 2010
• Notification of acceptance: 20 January 2011

Instructions for submitting your abstract

• Submit your abstract online
• If you have previously submitted an abstract or registered to attend an IOP Conference, please log in. For new users you will need to create an account. If you have forgotten your password, you can request details from the submission page.
• Enter your abstract title, and keywords if applicable
• Select your preference for an oral or poster presentation. The organising committee will note your preference, but is unable to guarantee your preferred choice of presentation.
• Indicate whether the work is predominantly student work
• Enter co-author(s) details if applicable (fields marked with an * are mandatory)
• Enter your abstract text in plain text – maximum 250 words
• Review your submission and select submit
• The corresponding author will receive an email confirming the submission.  If you do not receive an email, your abstract may not have been received and you are advised to contact the conferences team by email to conferences@iop.org or by telephone to +44 (0)20 7470 4800.

Abstract amendments

• Authors can amend their submission online up until the abstract deadline.
• To log in, you will need your submission password
• Amend your abstract accordingly.

If you are unable to submit your abstract online, please email the conferences team at conferences@iop.org or telephone +44 (0)20 7470 4800. Please ensure that you quote the name of the event when contacting us.

The main topic areas to be covered are as follows:

• The characterisation of as-grown semiconductors in both bulk and thin film forms
• The study of nanostructures of all types from quantum dots, wires, etc to nanotubes.
• The investigation of lattice defect and impurity behaviour in semiconducting materials.
• The study of the effects of semiconductor processing treatments - oxidation, nitridation, ion implantation, annealing, silicidation, etc.
• The assessment of finished electronic devices, including studies of the influence of structural defects upon their behaviour and important new design features such as high/low k dielectrics, etc.

Special conference sessions will focus attention on recent advances in a number of areas of particular current interest, for example:

• Developments in the use of high-resolution imaging and analytical transmission electron microscopy
• studies of bulk material, layers and interfaces.Advances in FIB milling and nanofabrication.
• The nature of epitaxial layers, superlattices and quantum well, wire and dot structures - strain relaxation, defect introduction, morphological distortion, self-organisation, luminescence.
• Wide bandgap semiconductors, especially III-nitrides.
• The structures of dislocations and defect boundaries in semiconductors.
• Advances in SiGe/Si for device structures such as HBTs, MOSFETs, terahertz emitters, etc.
• Metal-semiconductor contacts and silicides.
• The effects of processing treatments using both conventional and transient techniques.
• The exploitation of advanced scanning techniques - SEM-EBIC, SEM-CL, etc; STM, AFM, SCM, BEEM, etc.

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