IOP Conferences

4-7 April 2011
Churchill College, Cambridge, UK

Organised by the IOP Electron Microscopy and Analysis Group (EMAG)
Co-sponsored by Materials Research Society, the Royal Microscopical Society and the Society of Electron Microscope Technology.
Supported by The IET's Vision and Imaging Network

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The conference will focus on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the applications of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques including scanning probe microscopy and X-ray topography and diffraction will also be featured. Developments in materials science and technology covering the complete range of elemental and compound semiconductors will be described.

Key dates

  • Abstract submission deadline: 10 December 2010
  • Early registration deadline: 17 February 2011
  • Registration deadline: 27 March 2011
  • Paper submission deadline: 4 April 2011

Call for papers (PDF, 903 KB)


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